Test Probes

There is no place for inaccuracies during testing, due to the small dimensions in electronic devices. It’s known from practice - how fast a slipping can lead to the destruction of an electronic device or of a complete entire device. MC offers the right test probe for each specific application:

• Slim, spring-loaded stainless steel probes for finest applications 
• Strong steel probes for robust using 
• Sharp probes and high-quality contact surfaces to penetrate oxidation layers   
• IC - tip protection for secure contacting on ICs